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Article: Patents: Japanese Inventors Develop Storage System Fault Detection Method
- Article from:
- US Fed News Service, Including US State News
- Article date:
- February 12, 2009
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ALEXANDRIA, Va., Feb. 16 -- Nobuhiro Maki, Kenichi Oyamada and Hideaki Abe, all from Yokohama, Japan, and Yuri Hiraiwa of Sagamihara, Japan, have developed a method for detecting faults in computer storage system. The inventors were issued U.S. Patent No. 7,475,294 on Jan. 6. The patent has been assigned to Hitachi Ltd., Tokyo. The original application was filed on May 19, 2005. According to the U.S. Patent & Trademark Office: "The computer system includes a computer, a first storage system configured to be communicable with the computer, and a second storage system configured ...