Article: Patent No. 7,525,307 Issued on April 28, Assigned to Hitachi Global Storage Technologies Netherlands for Hard Drive Component Testing Method (California Inventors)

ALEXANDRIA, Va., May 2 -- Yong Shen, Saratoga, Calif., has developed a method for hard drive component testing. The inventor was issued U.S. Patent No. 7,525,307 on April 28.

The patent has been assigned to Hitachi Global Storage Technologies Netherlands B.V., Amsterdam, Netherlands.

According to the abstract released by the U.S. Patent & Trademark Office: "Embodiments of the present invention include a method and System for Hard Drive component testing, particularly for magnetic recording head testing. The method of testing magnetic recording heads includes: performing a magnetic write width test (on a plurality of disk drive heads), sorting the plurality of ...

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