Article: Patent No. 7,570,830 Issued on Aug. 4, Assigned to Altek for Image Sharpness Test Method (Taiwanese Inventors)

ALEXANDRIA, Va., Aug. 6 -- Peng Wei Lin and Chan Min Chou, both of Hsinchu, Taiwan, have developed a test method for image sharpness. The inventors were issued U.S. Patent No. 7,570,830 on Aug. 4.

The patent has been assigned to Altek Corp., Hsinchu.

According to the abstract released by the U.S. Patent & Trademark Office: "The present invention discloses a test method for image sharpness, which can instantly determine the sharpness of a captured image, wherein a captured image is firstly divided into multiple blocks with each block composed of multiple pixels; in each block of the captured image, the pixels having higher sharpnesses are selected, and the ...

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