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Article: Publication No. WO/2009/128114 Published on Oct. 22, Assigned to ADVANTEST for Semiconductor Testing Apparatus, Method (Japanese Inventor)
- Article from:
- US Fed News Service, Including US State News
- Article date:
- October 30, 2009
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GENEVA, Oct. 30 -- Daisuke Watanabe, Japan, has developed a semiconductor testing apparatus and testing method.
The patent has been assigned to ADVANTEST CORP., Tokyo.
According to an abstract posted by the World Intellectual Property Organization: "A semiconductor testing apparatus for performing a test on a first device as a device under test by connecting the first device which comprises a transmitter transmitting a differential signal and a second device which comprises a receiver receiving the differential signal. The transmitter includes an equalizer circuit which shapes a waveform of the differential signal to be transmitted. The receiver ...