Article: Patent No. 7,607,213 Issued on Oct. 27, Assigned to SNECMA for Deformation Measuring Method (French Inventors)

ALEXANDRIA, Va., Nov. 4 -- Pierre Bertrand of Montbelliard, France, Sebastien Lukat of Mulhouse, France, Christian Coddet of Giromagny, France, Sophie Costil of Offemont, France, and Frederic Leman of Montrouge, France, have developed a method of making a device for measuring deformation. The inventors were issued U.S. Patent No. 7,607,213 on Oct. 27.

The patent has been assigned to SNECMA, Paris.

According to the abstract released by the U.S. Patent & Trademark Office: "A method of making a device for measuring deformation includes a step of depositing a silicon adhesion underlayer on a ...

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