Article: Patent No. 7,616,021 Issued on Nov. 10, Assigned to Advanced Micro Devices for Operational Lifetime Determination Method (Texas Inventors)

ALEXANDRIA, Va., Nov. 11 -- Vassilios Papageorgiou and Amado Ramirez, both of Austin, Texas, and Michael Zhouying Su of Round Rock, Texas, have developed a method for determining an operational lifetime. The inventors were issued U.S. Patent No. 7,616,021 on Nov. 10.

The patent has been assigned to Advanced Micro Devices Inc., Sunnyvale, Calif.

According to the abstract released by the U.S. Patent & Trademark Office: "An integrated circuit device includes a degradable test structure, a first external interface pin and a second external interface pin, a first conductive path coupling a first node of the degradable test structure and the first external interface pin, and a second ...

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