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Tests characterize high-frequency material properties
- Article from:
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Microwaves & RF
- Article date:
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August 1, 1997
- Author:
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;
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Copyright informationCopyright Penton Publishing and Marketing Aug 1997. Provided by ProQuest LLC. (Hide copyright information)
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A microstrip-resonator-based measurement setup is used to evaluate materials across a 0.5-to-20-GHz frequency range.
As applications for microwave circuitry continue to expand (notably in portable communications systems) and operating speeds of digital integrated circuits (ICs) continue to increase, a need is being created for high-frequency data on material properties (dielectric constant, loss tangent, and attenuation). As part of a test program to obtain high-frequency material data, the characteristics of advanced ceramic materials were measured from 500 MHz to 20 GHz and benchmarked against conductors on 96-percent alumina substrates and printed-wiring board (PWB) laminates.
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