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Home » Publications » Math and Engineering journals » EE-Evaluation Engineering » December 2004 »
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    "Pattern-matching technology.(INSPECTION PRODUCTS)." EE-Evaluation Engineering. NP Communications, LLC. 2004. HighBeam Research. 22 Apr. 2018 <https://www.highbeam.com>.

    Chicago

    "Pattern-matching technology.(INSPECTION PRODUCTS)." EE-Evaluation Engineering. 2004. HighBeam Research. (April 22, 2018). https://www.highbeam.com/doc/1G1-126236831.html

    APA

    "Pattern-matching technology.(INSPECTION PRODUCTS)." EE-Evaluation Engineering. NP Communications, LLC. 2004. Retrieved April 22, 2018 from HighBeam Research: https://www.highbeam.com/doc/1G1-126236831.html

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Pattern-matching technology.(INSPECTION PRODUCTS)

EE-Evaluation Engineering
EE-Evaluation Engineering

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December 1, 2004 | Copyright
COPYRIGHT 2009 Nelson Publishing. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights or concerns about this content should be directed to Customer Service.
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Enhancements for pattern location and alignment have been added to the PatMax[R] geometric pattern matching technology available with the company's PC-based programmable vision systems. PatMax XLC (eXtremely Low Contrast) improves the capability of PatMax to find barely visible objects or patterns in grainy or faint images like those produced by scanning electron microscopes. …


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