Wafer Probing System.(ATE)
The high-speed, tabletop SA-6 Semiautomatic Probing System accommodates wafers 6" and smaller. It is configurable for RF/microwave, failure analysis, MEMS, optoelectronics, discrete device characterization, and R & D applications. A variety of accessories such as optics, lasers, and thermal systems can be added to upgrade system capabilities. …
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