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"Wafer Probing System.(ATE)." EE-Evaluation Engineering. NP Communications, LLC. 2006. HighBeam Research. 20 Apr. 2018 <https://www.highbeam.com>.
"Wafer Probing System.(ATE)." EE-Evaluation Engineering. 2006. HighBeam Research. (April 20, 2018). https://www.highbeam.com/doc/1G1-150977757.html
"Wafer Probing System.(ATE)." EE-Evaluation Engineering. NP Communications, LLC. 2006. Retrieved April 20, 2018 from HighBeam Research: https://www.highbeam.com/doc/1G1-150977757.html
The high-speed, tabletop SA-6 Semiautomatic Probing System accommodates wafers 6" and smaller. It is configurable for RF/microwave, failure analysis, MEMS, optoelectronics, discrete device characterization, and R & D applications. A variety of accessories such as optics, lasers, and thermal systems can be added to upgrade system capabilities. …
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