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Home » Publications » Math and Engineering journals » EE-Evaluation Engineering » February 2007 »
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    MLA

    "JTAG Technologies/SPEA system combines ICT and boundary scan.(NEWS'n NOTES)." EE-Evaluation Engineering. NP Communications, LLC. 2007. HighBeam Research. 22 Apr. 2018 <https://www.highbeam.com>.

    Chicago

    "JTAG Technologies/SPEA system combines ICT and boundary scan.(NEWS'n NOTES)." EE-Evaluation Engineering. 2007. HighBeam Research. (April 22, 2018). https://www.highbeam.com/doc/1G1-159381629.html

    APA

    "JTAG Technologies/SPEA system combines ICT and boundary scan.(NEWS'n NOTES)." EE-Evaluation Engineering. NP Communications, LLC. 2007. Retrieved April 22, 2018 from HighBeam Research: https://www.highbeam.com/doc/1G1-159381629.html

    Please use HighBeam citations as a starting point only. Not all required citation information is available for every article, and citation requirements change over time.

JTAG Technologies/SPEA system combines ICT and boundary scan.(NEWS'n NOTES)

EE-Evaluation Engineering
EE-Evaluation Engineering

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February 1, 2007 | Copyright
COPYRIGHT 2009 Nelson Publishing. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights or concerns about this content should be directed to Customer Service.
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    <a href="https://www.highbeam.com/doc/1G1-159381629.html" title="JTAG Technologies/SPEA system combines ICT and boundary scan.(NEWS'n NOTES) | HighBeam Research">JTAG Technologies/SPEA system combines ICT and boundary scan.(NEWS'n NOTES)</a>

SPEA S.p.A., an ATE designer and manufacturer, and JTAG Technologies, a provider of boundary scan software and hardware products and services, have integrated their test methods within the SPEA 3030 In-Circuit Test System. The 3030 features shorts/opens, analog, power-up, digital, vectorless, and AOI testing options. …


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