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"Memory test solution developed for small-lot production.(PRODUCT BRIEFING)(Brief article)." EE-Evaluation Engineering. NP Communications, LLC. 2007. HighBeam Research. 21 Apr. 2018 <https://www.highbeam.com>.
"Memory test solution developed for small-lot production.(PRODUCT BRIEFING)(Brief article)." EE-Evaluation Engineering. 2007. HighBeam Research. (April 21, 2018). https://www.highbeam.com/doc/1G1-170116016.html
"Memory test solution developed for small-lot production.(PRODUCT BRIEFING)(Brief article)." EE-Evaluation Engineering. NP Communications, LLC. 2007. Retrieved April 21, 2018 from HighBeam Research: https://www.highbeam.com/doc/1G1-170116016.html
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The V5000ep Test Solution performs quality assurance, characterization, and small-lot production testing at wafer sort and final test on new memory devices. It supports most memory devices including NOR, NAND, DRAM, SRAM, memory cards, and multichip packages. The small-footprint unit also can be used with thermal environmental chambers for extreme hot and cold characterization testing.
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Through a standard integration kit, the V5000ep interfaces to a prober or handler. …
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