Memory test solution developed for small-lot production.(PRODUCT BRIEFING)(Brief article)
The V5000ep Test Solution performs quality assurance, characterization, and small-lot production testing at wafer sort and final test on new memory devices. It supports most memory devices including NOR, NAND, DRAM, SRAM, memory cards, and multichip packages. The small-footprint unit also can be used with thermal environmental chambers for extreme hot and cold characterization testing.
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Through a standard integration kit, the V5000ep interfaces to a prober or handler. …
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Memory Test System.
Semiconductor International; October 15, 2007
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