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Home » Publications » Math and Engineering journals » EE-Evaluation Engineering » October 2007 »
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    MLA

    "Memory test solution developed for small-lot production.(PRODUCT BRIEFING)(Brief article)." EE-Evaluation Engineering. NP Communications, LLC. 2007. HighBeam Research. 21 Apr. 2018 <https://www.highbeam.com>.

    Chicago

    "Memory test solution developed for small-lot production.(PRODUCT BRIEFING)(Brief article)." EE-Evaluation Engineering. 2007. HighBeam Research. (April 21, 2018). https://www.highbeam.com/doc/1G1-170116016.html

    APA

    "Memory test solution developed for small-lot production.(PRODUCT BRIEFING)(Brief article)." EE-Evaluation Engineering. NP Communications, LLC. 2007. Retrieved April 21, 2018 from HighBeam Research: https://www.highbeam.com/doc/1G1-170116016.html

    Please use HighBeam citations as a starting point only. Not all required citation information is available for every article, and citation requirements change over time.

Memory test solution developed for small-lot production.(PRODUCT BRIEFING)(Brief article)

EE-Evaluation Engineering
EE-Evaluation Engineering

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October 1, 2007 | Copyright
COPYRIGHT 2009 Nelson Publishing. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights or concerns about this content should be directed to Customer Service.
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    <a href="https://www.highbeam.com/doc/1G1-170116016.html" title="Memory test solution developed for small-lot production.(PRODUCT BRIEFING)(Brief article) | HighBeam Research">Memory test solution developed for small-lot production.(PRODUCT BRIEFING)(Brief article)</a>

The V5000ep Test Solution performs quality assurance, characterization, and small-lot production testing at wafer sort and final test on new memory devices. It supports most memory devices including NOR, NAND, DRAM, SRAM, memory cards, and multichip packages. The small-footprint unit also can be used with thermal environmental chambers for extreme hot and cold characterization testing.

[ILLUSTRATION OMITTED]

Through a standard integration kit, the V5000ep interfaces to a prober or handler. …


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Related articles on HighBeam Research

Semiconductor International
Memory Test System.

Semiconductor International; October 15, 2007

202 words
Staff V5000ep is a memory test solution that performs quality assurance, characterization and small lot production at wafer sort and final test on memory devices. Pin count of the test system is 768 tester resource pins, which allows for the testing of higher-pincount devices. It can be automated…
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