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Home » Publications » Math and Engineering journals » EE-Evaluation Engineering » February 2008 »
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    MLA

    "Transient test solutions.(LITERATURE MARKETPLACE)." EE-Evaluation Engineering. NP Communications, LLC. 2008. HighBeam Research. 19 Apr. 2018 <https://www.highbeam.com>.

    Chicago

    "Transient test solutions.(LITERATURE MARKETPLACE)." EE-Evaluation Engineering. 2008. HighBeam Research. (April 19, 2018). https://www.highbeam.com/doc/1G1-175075111.html

    APA

    "Transient test solutions.(LITERATURE MARKETPLACE)." EE-Evaluation Engineering. NP Communications, LLC. 2008. Retrieved April 19, 2018 from HighBeam Research: https://www.highbeam.com/doc/1G1-175075111.html

    Please use HighBeam citations as a starting point only. Not all required citation information is available for every article, and citation requirements change over time.

Transient test solutions.(LITERATURE MARKETPLACE)

EE-Evaluation Engineering
EE-Evaluation Engineering

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February 1, 2008 | Copyright
COPYRIGHT 2009 Nelson Publishing. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights or concerns about this content should be directed to Customer Service.
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CONDUCTED SUCEPTABILITY: System includes generator, coupling, calibration, waveform verification solutions to meet requirements of CS106, CS115, CS116; DO 160 Sections 17, 19; Airbus AMD 24C; many more. RS105: Turnkey solutions. Wide range of antenna sizes, pulse generators to produce 50-kV/m. …


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