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Home » Publications » Math and Engineering journals » EE-Evaluation Engineering » December 2009 »
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    MLA

    Sguigna, Alan. "Approaching board test nonintrusively.(TEST SOFTWARE)." EE-Evaluation Engineering. NP Communications, LLC. 2009. HighBeam Research. 21 Apr. 2018 <https://www.highbeam.com>.

    Chicago

    Sguigna, Alan. "Approaching board test nonintrusively.(TEST SOFTWARE)." EE-Evaluation Engineering. 2009. HighBeam Research. (April 21, 2018). https://www.highbeam.com/doc/1G1-214620029.html

    APA

    Sguigna, Alan. "Approaching board test nonintrusively.(TEST SOFTWARE)." EE-Evaluation Engineering. NP Communications, LLC. 2009. Retrieved April 21, 2018 from HighBeam Research: https://www.highbeam.com/doc/1G1-214620029.html

    Please use HighBeam citations as a starting point only. Not all required citation information is available for every article, and citation requirements change over time.

Approaching board test nonintrusively.(TEST SOFTWARE)

EE-Evaluation Engineering
EE-Evaluation Engineering

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December 1, 2009 | Sguigna, Alan | Copyright
COPYRIGHT 2009 Nelson Publishing. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights or concerns about this content should be directed to Customer Service.
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    <a href="https://www.highbeam.com/doc/1G1-214620029.html" title="Approaching board test nonintrusively.(TEST SOFTWARE) | HighBeam Research">Approaching board test nonintrusively.(TEST SOFTWARE)</a>

It's inevitable. Basic electronic technology evolves. Chips and circuit boards are designed and made differently today than they were 10 years or even five years ago. It stands to reason that the technologies that manufacturers have deployed to test chips and circuit boards would evolve right along with the chips and boards.

In a quiet way, test methods have evolved. But now the test industry is fast approaching a tipping point where the older, intrusive, hardware-based test techniques must be complemented, supplemented, or outright replaced by newer, software-driven, nonintrusive test technologies. What's driving this trend is what has always driven the test industry: test coverage. Without it, test engineers look elsewhere, and that's what they're doing today.

New nonintrusive board test (NBT) techniques are making significant inroads for two reasons:

* Test coverage is eroding because today's evolved technologies can't be tested with the old methods.

* The economics of today's electronics industry demands more cost-effective test methods such as NBT.

Where's the Coverage Going?

Nonintrusive test technologies like boundary scan (JTAG), processor-controlled test (PCT), and certain types of BIST such as Intel's Interconnect Built-in Self-Test (IBIST) have a big advantage over the older, intrusive test technologies, including in-circuit testers (ICT), manufacturing defects analyzers (MDA), flying-probe testers, oscilloscopes, and logic analyzers. The software-driven nonintrusive techniques do not require physical contact with a chip or board the way that probe-based or bed-of-nail intrusive technologies do. …


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