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Home » Publications » Math and Engineering journals » EE-Evaluation Engineering » December 2009 »
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    "LTE Suite for PXI Platform.(COMMUNICATIONS TEST PRODUCTS)." EE-Evaluation Engineering. NP Communications, LLC. 2009. HighBeam Research. 23 Apr. 2018 <https://www.highbeam.com>.

    Chicago

    "LTE Suite for PXI Platform.(COMMUNICATIONS TEST PRODUCTS)." EE-Evaluation Engineering. 2009. HighBeam Research. (April 23, 2018). https://www.highbeam.com/doc/1G1-214620035.html

    APA

    "LTE Suite for PXI Platform.(COMMUNICATIONS TEST PRODUCTS)." EE-Evaluation Engineering. NP Communications, LLC. 2009. Retrieved April 23, 2018 from HighBeam Research: https://www.highbeam.com/doc/1G1-214620035.html

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LTE Suite for PXI Platform.(COMMUNICATIONS TEST PRODUCTS)

EE-Evaluation Engineering
EE-Evaluation Engineering

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December 1, 2009 | Copyright
COPYRIGHT 2009 Nelson Publishing. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights or concerns about this content should be directed to Customer Service.
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    <a href="https://www.highbeam.com/doc/1G1-214620035.html" title="LTE Suite for PXI Platform.(COMMUNICATIONS TEST PRODUCTS) | HighBeam Research">LTE Suite for PXI Platform.(COMMUNICATIONS TEST PRODUCTS)</a>

The Long Term Evolution (LTE) Measurement Suite has been added to the company's PXI 3000 Series Modular Test Platform. It enables characterization of LTE FDD signals in accordance with the requirements outlined in 3GPP Release 8, allowing LTE analysis of the single-carrier frequency division multiple access. In addition to numerical measurement results, the suite provides trace displays for spectrum emission mask, complementary cumulative distribution function, constellation plots, error-vector magnitude (EVM) vs. …


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